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Energy spectra of shallow traps in SiSiO2 structures implanted with boron ions at various implantation energies

✍ Scribed by Lysenko, V. S. ;Sytenko, T. K. ;Zimenko, V. I. ;Tyagulskii, I. P. ;Snitko, O. V.

No coin nor oath required. For personal study only.

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