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Endogenous and exogenous hydrogen influence on amorphous silicon thin films analysis by pulsed radiofrequency glow discharge optical emission spectrometry

✍ Scribed by Pascal Sánchez; Deborah Alberts; Beatriz Fernández; Armando Menéndez; Rosario Pereiro; Alfredo Sanz-Medel


Book ID
116179313
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
590 KB
Volume
714
Category
Article
ISSN
0003-2670

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