Empirical nonlinear modeling for RF MOSFETs

✍ Scribed by Seonghearn Lee

• Book ID: 102517909
• Publisher: John Wiley and Sons
• Year: 2004
• Tongue: English
• Weight: 412 KB
• Volume: 14
• Category: Article
• ISSN: 1096-4290
• DOI: 10.1002/mmce.10129

✦ Synopsis

A new empirical model with an external substrate network is proposed to simulate the RF nonlinear characteristics of a MOSFET accurately in the wide range of operating bias points. An accurate drain current equation is developed to model the nonlinear transconductance characteristics of a RF MOSFET, and improved nonlinear capacitance equations are used. The values of modeled S 21 parameters using the new drain current equation show much better agreement with measured ones than those using the conventional formula over the wide bias range, thus verifying the accuracy of the new model.