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Empirical global modelling of Si/SiGe heterojunction bipolar transistors

โœ Scribed by Taher, H.


Book ID
117812393
Publisher
The Institution of Engineering and Technology
Year
2008
Tongue
English
Weight
591 KB
Volume
2
Category
Article
ISSN
1751-8725

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Self heating modeling of SiGe heterojunc
โœ Pierre Yvan Sulima; Jean-Luc Battaglia; Thomas Zimmer; J.-C. Batsale ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 736 KB

A model of heat transfer in a SiGe heterojunction bipolar transistor (HBT) at the macro scale is established, that leads to an analytical solution. Modelling is based on the use of integral transforms as the Fourier and Laplace ones. The heat source is assumed as a heat flux applied at the base-coll