✦ LIBER ✦

Ellipsometry measurements on SiO2 films for thicknesses under 200Å

✍ Scribed by Jau Hwang Ho; Chung Len Lee; Chein Wei Jen; Tan Fu Lei

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Spectrophotometric Thickness Measurement

✍ Rand, Myron J. 📂 Article 📅 1970 🏛 American Institute of Physics 🌐 English ⚖ 549 KB

Density, thickness and composition measu

✍ A. Hodroj; H. Roussel; A. Crisci; F. Robaut; U. Gottlieb; J.L. Deschanvres 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 536 KB

Optical thickness measurement of SiO2Si

✍ F. Reizman; W. van Gelder 📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 666 KB

A Technique in Ellipsometry for Measurin

✍ Hemming, D. 📂 Article 📅 1969 🏛 The Optical Society 🌐 English ⚖ 579 KB

Thickness of SiO2thin film on silicon wa

✍ P. Hlubina; D. Ciprian; J. Luňáček; M. Lesňák 📂 Article 📅 2006 🏛 Springer 🌐 English ⚖ 271 KB

Phase retrieval from the spectral interf

✍ P. Hlubina; D. Ciprian; J. Luňáček; R. Chlebus 📂 Article 📅 2007 🏛 Springer 🌐 English ⚖ 520 KB