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Ellipsometric spectroscopy study of Ar ion-beam mixed SiO2/Si/SiO2 layers

โœ Scribed by H.B. Kim; J.H. Son; C.N. Whang; K.H. Chae


Book ID
113822709
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
326 KB
Volume
216
Category
Article
ISSN
0168-583X

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