Ellipsometric investigations in situ of thin ytterbium layers
✍ Scribed by Krystyna Z̶ukowska; Ewa Oleszkiewicz
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 297 KB
- Volume
- 224
- Category
- Article
- ISSN
- 0040-6090
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📜 SIMILAR VOLUMES
Optical investigations of self-polarized PbZr 0.235 Ti 0.765 O 3 (PZT) films deposited onto Si/SiO 2 /adhesion layer/(111) Pt substrate by RF sputtering are presented in this work. Measurements were performed with a spectral ellipsometer working in rotating analyzer mode. To obtain the temperature d
**Uniform thin films of gold nanoparticles** have been fabricated on gold substrates using a layer‐by‐layer self‐assembly approach (see Figure). The optical properties of these nanoparticle films were characterized using variable‐angle spectroscopic ellipsometry, and the data modeled using a Lorentz