✦ LIBER ✦

Elemental content in deionized water by total-reflection X-ray fluorescence spectrometry

✍ Scribed by G. A. Tavares; E. Almeida; J. G. G. de Oliveira; J. A. Bendassolli; V. F. Nascimento Filho

Publisher: Springer
Year: 2010
Tongue: English
Weight: 751 KB
Volume: 287
Category: Article
ISSN: 1588-2780
DOI: 10.1007/s10967-010-0885-x

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Simultaneous determination of elemental

Simultaneous determination of elemental content in water samples by total reflection X-ray fluorescence and atomic absorption spectrometry

✍ M. G. Macedo-Miranda; G. Zarazua; E. Mejía-Zarate; P. Avila-Pérez; B. Barrientos 📂 Article 📅 2009 🏛 Springer 🌐 English ⚖ 148 KB

Direct analysis of Al2O3powders by total

Direct analysis of Al2O3powders by total reflection X-ray fluorescence spectrometry

✍ Birgit U. Peschel; Ursula E. A. Fittschen; Giancarlo Pepponi; Christoph Jokuboni 📂 Article 📅 2005 🏛 Springer 🌐 English ⚖ 302 KB

An elemental correlation study in cancer

An elemental correlation study in cancerous breast tissue by total reflection x-ray fluorescence

✍ Urszula Majewska; Janusz Braziewicz; Dariusz BanaŚ; Aldona Kubala-KukuŚ; Stanisł 📂 Article 📅 1997 🏛 Humana Press Inc 🌐 English ⚖ 617 KB

Applications of total reflection X-ray f

Applications of total reflection X-ray fluorescence spectrometry in trace element and surface analysis

✍ H. Schwenke; P. A. Beaven; J. Knoth 📂 Article 📅 1999 🏛 Springer 🌐 English ⚖ 342 KB

Application of total-reflection X-ray fl

Application of total-reflection X-ray fluorescence spectrometry in material analysis

✍ Hoffmann, Peter ;Kein, Martin ;Scheuer, Volker ;Lieser, Karl Heinrich 📂 Article 📅 1990 🏛 Springer-Verlag ⚖ 385 KB

Multi-element analysis of fine roots of

Multi-element analysis of fine roots of Scots pine by total reflection x-ray fluorescence spectrometry

✍ Marie Olsson; Arturs Viksna; Heljä-Sisko Helmisaari 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 54 KB 👁 2 views

The aim of this work was to investigate whether total reflection x-ray fluorescence (TXRF) is a satisfactory technique for the determination of trace element concentrations in fine roots. Fine roots in diameter classes <1 and 1-2 mm from Scots pine (Pinus sylvestris L.) were used. The roots were col