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Electrostatic particle sampler for total-reflection X-ray fluorescence analysis

✍ Scribed by J. Dixkens; H. Fissan


Book ID
117130208
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
549 KB
Volume
22
Category
Article
ISSN
0021-8502

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Surface analysis by total-reflection X-r
✍ HΓ©ctor J. Sanchez; Carlos A. Perez; Roberto D. Perez; Marcelo Rubio πŸ“‚ Article πŸ“… 1996 πŸ› Elsevier Science 🌐 English βš– 523 KB

Ah&act--This work shows the feasibility of surface analysis though the detection of characteristic fluorescent radiation in the total-reflection regime. A theoretical formalism to correlate surface parameters with X-ray Buorescence intensities from multiple-layer samples was developed. Experimental