Electronics reliability and measurement technology–non-destructive evaluation. Edited by Joseph S. Heyman, Noyes Publications, 1988, xii, 188 pp., bound, $ 39.–. ISBN 0-8155-1171-X

✍ Scribed by Hans Reiner

• Book ID: 101411229
• Publisher: John Wiley and Sons
• Year: 1989
• Tongue: English
• Weight: 242 KB
• Volume: 1
• Category: Article
• ISSN: 0935-9648
• DOI: 10.1002/adma.19890011119