Electronics reliability and measurement technology: Nondestructive Evaluation Author: Joseph S. Heyman Publishers: Noyes data corporation, Noyes Publications, Publicity Department, Mill Road at Grand Avenue, Park Ridge, New Jersey 07656, United States of America. Price: $ 39.00. (ISBN 0-8155-1171-X). Published 1988

✍ Scribed by G.W.A.D.

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 60 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90188-s