Electronics Reliability and Measurement Technology–-Non-Destructive Evaluation. Edited by Joseph S. Heyman, Noyes Publications, 1988, xii, 188 pp., bound, $ 39.–.ISBN 0-8155-1171-X

✍ Scribed by Hans Reiner

• Book ID: 101526504
• Publisher: John Wiley and Sons
• Year: 1989
• Tongue: English
• Weight: 217 KB
• Volume: 101
• Category: Article
• ISSN: 0044-8249
• DOI: 10.1002/ange.19891011156