## Surface modification and characterization are being undertaken increasingly using the MeV heavy ion beams. Interpretation of such data requires reliable and precise values of stopping powers involved. Sufficient data exists above 2.5 MeV/n but less information is available at lower energies. Th
β¦ LIBER β¦
Electronic stopping power measurements using secondary ion beams
β Scribed by N. Nath; O.P. Dahinwal; A. Bhagwat; D.K. Avasthi; V. Harikumar; A.P. Pathak
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 366 KB
- Volume
- 66
- Category
- Article
- ISSN
- 0257-8972
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