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Measurement of stopping powers using ion-induced X-ray emission

โœ Scribed by R.E. Marshall; A.R. El Fiqi; J.K. Kliwer


Publisher
Elsevier Science
Year
1978
Weight
334 KB
Volume
150
Category
Article
ISSN
0029-554X

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To date, the trace elemental analysis of solids with inhomogeneous internal structure has been limited, particularly in the case of adsorbents. High-energy ion beam based particle induced X-ray emission (PIXE) is an ideal analytical tool suitable for simultaneous quantification of trace elements wit