Electronic speckle pattern interferometr
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L. Augulis; S. TamulevicΜius; R. Augulis; J. Bonneville; P. Goudeau; C. Templier
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Article
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2004
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Elsevier Science
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English
β 268 KB
The design, performance and principles of computerised control of an optical micro-electromechanical device combining microtensile device and electronic speckle pattern interferometry (ESPI) to test both elastic and plastic properties of thin metallic, dielectric as well as multilayered freestanding