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Biaxial testing of orthotropic materials using electronic speckle pattern interferometry

โœ Scribed by J. Eberhardsteiner


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
760 KB
Volume
16
Category
Article
ISSN
0263-2241

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โœ M.A. CAPONERO; P. PASQUA; A. PAOLOZZI; I. PERONI ๐Ÿ“‚ Article ๐Ÿ“… 2000 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 549 KB

The paper presents the use of Holographic Interferometry and Electronic Speckle Pattern Interferometry for the measurement of dynamic surface displacements. A concise theoretical background of the optical phenomena on which the two techniques are based is given. Analysis of holographic and speckle f