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Electronic Speckle Pattern Interferometry for Micromechanical Measurements

✍ Scribed by S. Tamulevičius; L. Augulis; G. Laukaitis; M. Žadvydas

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 211 KB
Volume: 4
Category: Article
ISSN: 1438-1656
DOI: 10.1002/1527-2648(20020806)4:8<546::aid-adem546>3.0.co;2-6

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