Dielectric loss caused by oxygen vacanci
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Robert C. Pullar; Stuart J. Penn; Xiaoru Wang; Ian M. Reaney; Neil McN. Alford
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Article
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2009
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Elsevier Science
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English
โ 533 KB
Undoped TiO 2 exhibited deterioration in microwave (MW) dielectric loss as it reached its maximum density due to the reduction of Ti 4+ to Ti 3+ causing oxygen vacancies at high sintering temperatures. By adding small amounts of acceptor dopants with ionic radii between 0.5 and 0.95 ร , reduction dur