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Electronic properties of ion-implanted yttria-stabilized zirconia

✍ Scribed by U. Vohrer; H.-D. Wiemhöfer; W. Göpel; B.A. van Hassel; A.J. Burggraaf


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
630 KB
Volume
59
Category
Article
ISSN
0167-2738

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EXAFS (Extended X-ray Absorption Fine Structure) studies of cubic (ZrOz)l\_x(Y203) x are reported for the concentration range 0.09 < x < 0.4. When the trivalent Y ions are substituted for the tetravalent Zr ions, 02-vacancies are also introduced for charge compensation. However, the distribution of