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Electron trapping/detrapping within thin SiO2 films in the high field tunneling regime

✍ Scribed by Olivo, P.; Riccó, B.; Sangiorgi, E.


Book ID
121730026
Publisher
American Institute of Physics
Year
1983
Tongue
English
Weight
951 KB
Volume
54
Category
Article
ISSN
0021-8979

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