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[IEEE ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Penang, Malaysia (26-28 Nov. 1996)] ICSE '96. 1996 IEEE International Conference on Semiconductor Electronics. Proceedings - Thermal and field enhanced emission of trapped holes in thin SiO/sub 2/ films

✍ Scribed by Khosru, Q.D.M.; Taniguchi, K.; Hamaguchi, C.

Book ID: 126631961
Publisher: IEEE
Year: 1996
Weight: 405 KB
Category: Article
ISBN-13: 9780780333888
DOI: 10.1109/SMELEC.1996.616440

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