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Electron trapping properties of Ge-implanted SiO2

✍ Scribed by J.M.M. de Nijs; P. Balk

Publisher: Elsevier Science
Year: 1993
Tongue: English
Weight: 336 KB
Volume: 22
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(93)90144-t

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