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Electron mobility model for strained-Si devices

✍ Scribed by Dhar, S.; Kosina, H.; Palankovski, V.; Ungersboeck, S.E.; Selberherr, S.


Book ID
114617735
Publisher
IEEE
Year
2005
Tongue
English
Weight
480 KB
Volume
52
Category
Article
ISSN
0018-9383

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