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Electron microscopy and spectroscopy investigations of CuOx–CeO2−δ/Si thin films

✍ Scribed by A. Kopia; K. Kowalski; M. Chmielowska; Ch. Leroux

Book ID: 108280623
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 971 KB
Volume: 602
Category: Article
ISSN: 0039-6028
DOI: 10.1016/j.susc.2007.12.041

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