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Electron microscopic investigation of MnSi1.7 layers on Si(001)

โœ Scribed by A Mogilatenko; M Falke; S Teichert; S Schwendler; D.K Sarkar; H.-J Hinneberg

Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
886 KB
Volume
60
Category
Article
ISSN
0167-9317

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โœฆ Synopsis

Semiconducting higher manganese silicides (HMS) with a composition near that of MnSi are of special 1.7 interest due to their thermoelectric properties. We report on the growth of HMS layers deposited by MBE using the template technique. In particular the influence of the template thickness on the structure and morphology of MnSi films on (001)Si substrates was investigated. It was found that there is an optimal template thickness 1.7 that causes preferred epitaxial growth of the major amount of the silicide. Three different epitaxial orientation relations of the silicide crystals to the substrate were observed. Considering the specific features of the electron diffraction patterns of MnSi the HMS phase was identified as Mn Si .

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