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Electron irradiation induced recombination centers in silicon-minority carrier lifetime control

✍ Scribed by Rai-Choudhury, P.; Bartko, J.; Johnson, J.E.

Book ID: 114592137
Publisher: IEEE
Year: 1976
Tongue: English
Weight: 580 KB
Volume: 23
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1976.18491

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