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Electron holography available in a non-biprism transmission electron microscope

✍ Scribed by Q. Ru; N. Osakabe; J. Endo; A. Tonomura


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
785 KB
Volume
53
Category
Article
ISSN
0304-3991

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Transmission electron microscope in situ
✍ Vecchio, Kenneth S. ;Hunt, John A. ;Williams, David B. πŸ“‚ Article πŸ“… 1991 πŸ› Wiley (John Wiley & Sons) 🌐 English βš– 559 KB

A computer-control procedure was developed to facilitate in situ fatigue experiments within an intermediate voltage transmission electron microscope using a goniometer-type straining holder. The procedure was designed to allow sine-wave tension-tension cyclic loading of a microfatigue specimen simil