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Electron holography: optimum position of the biprism in the electron microscope

โœ Scribed by Hannes Lichte


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
466 KB
Volume
64
Category
Article
ISSN
0304-3991

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Optimum specimen positioning in the elec
โœ Turner, J. N. ;Rieder, C. L. ;Collins, D. N. ;Chang, B. B. ๐Ÿ“‚ Article ๐Ÿ“… 1989 ๐Ÿ› Wiley (John Wiley & Sons) ๐ŸŒ English โš– 852 KB

Optimal imaging of complex structures requires proper alignment relative to the optic axis of the electron microscope. This is especially important for high-voltage and intermediatevoltage microscopes, which form an in-focus image throughout the entire thickness of the object. As a result, structure