<p><p>Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, <i>Electron Energy-Loss Spectroscopy in
Electron Energy-Loss Spectroscopy in the Electron Microscope
โ Scribed by Ray F. Egerton (auth.)
- Publisher
- Springer US
- Year
- 1995
- Tongue
- English
- Leaves
- 417
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Table of Contents
Front Matter....Pages i-xii
An Introduction to Electron Energy-Loss Spectroscopy....Pages 1-25
Instrumentation for Energy-Loss Spectroscopy....Pages 27-128
Electron Scattering Theory....Pages 129-228
Quantitative Analysis of the Energy-Loss Spectrum....Pages 229-289
Applications of Energy-Loss Spectroscopy....Pages 291-352
Back Matter....Pages 353-410
โฆ Subjects
Spectroscopy/Spectrometry;Spectroscopy and Microscopy;Atomic, Molecular, Optical and Plasma Physics;Analytical Chemistry
๐ SIMILAR VOLUMES
<p><p>Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, <i>Electron Energy-Loss Spectroscopy in
<span>This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpos
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and application