<p><p>Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, <i>Electron Energy-Loss Spectroscopy in
Electron energy loss spectroscopy
โ Scribed by Brydson, Rik
- Publisher
- BIOS Scientific Publishers; Garland Science
- Year
- 2001;2020
- Tongue
- English
- Leaves
- 150
- Series
- Microscopy handbooks 48
- Category
- Library
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โฆ Synopsis
Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and applications of EELS. Specific topics covered include, theory of EELS, elemental quantification, EELS fine structure, EELS imaging and advanced techniques.
โฆ Table of Contents
Cover......Page 1
Half Title......Page 2
Title Page......Page 4
Copyright Page......Page 5
Table of Contents......Page 6
Abbreviations......Page 10
Preface......Page 12
Acknowledgements......Page 13
What is EELS?......Page 14
Interaction of electrons with matter......Page 15
Basics of the TEM......Page 30
Comparison of EELS in TEM with other spectroscopies......Page 33
References......Page 38
Historical development......Page 40
Basic components of an EEL spectrum......Page 42
Basic physics......Page 45
Summary of analytical uses......Page 49
References......Page 50
The electron spectrometer......Page 52
Coupling a magnetic spectrometer to the microscope......Page 55
Spectral recording......Page 57
Energy-filtered imaging......Page 62
Choice of experimental conditions for EELS......Page 64
Specimen parameters......Page 69
Summary of experimental set-up and data acquisition procedures for EELS......Page 70
References and further reading......Page 71
Quantification of sample thickness......Page 72
Quantitative aspects of low loss data......Page 74
Experimental aspects of EELS low loss measurements......Page 79
References and further reading......Page 80
Quantification of EEL spectra......Page 82
Background removal......Page 83
Determination of the ionization cross-section......Page 85
Final quantification step......Page 88
Summary of experimental quantification parameters......Page 89
Accuracy and detection sensitivity of EELS quantification and comparison with EDX in the TEM......Page 90
References and further reading......Page 91
Origin of edge fine structure......Page 92
Determination of coordinations......Page 97
Determination of valencies......Page 101
Determination of bond lengths......Page 104
Experimental aspects of ELNES/EXELFS measurements......Page 106
References and further reading......Page 108
Introduction to EELS imaging and energy filtering......Page 110
Summary of energy-filtering techniques......Page 112
Procedure for EFTEM elemental mapping......Page 114
Experimental parameters in EFTEM......Page 117
General strategy for EFTEM elemental analysis......Page 122
Experimental procedure for EFTEM image acquisition and processing......Page 123
Comparison of EFTEM and spectrum imaging methods......Page 124
Energy-filtered tomography......Page 125
References and further reading......Page 126
Orientation dependency in EELS......Page 128
Spatially resolved measurements......Page 131
Electron Compton scattering......Page 138
Reflection mode and surface measurements......Page 139
References and further reading......Page 140
Further reading......Page 142
Further resources......Page 143
Index......Page 146
๐ SIMILAR VOLUMES
<p><p>Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, <i>Electron Energy-Loss Spectroscopy in
<span>This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpos