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๐Ÿ“

Electron Energy-Loss Spectroscopy in the Electron Microscope

โœ Scribed by R. F. Egerton (auth.)


Publisher
Springer US
Year
1996
Tongue
English
Leaves
490
Category
Library

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โœฆ Table of Contents


Front Matter....Pages i-xi
An Introduction to Electron Energy-Loss Spectroscopy....Pages 1-29
Instrumentation for Energy-Loss Spectroscopy....Pages 31-129
Electron Scattering Theory....Pages 131-243
Quantitative Analysis of the Energy-Loss Spectrum....Pages 245-299
Applications of Energy-Loss Spectroscopy....Pages 301-402
Back Matter....Pages 403-485

โœฆ Subjects


Biological Microscopy;Analytical Chemistry;Atomic, Molecular, Optical and Plasma Physics;Characterization and Evaluation of Materials


๐Ÿ“œ SIMILAR VOLUMES


Electron Energy-Loss Spectroscopy in the
โœ R.F. Egerton (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2011 ๐Ÿ› Springer US ๐ŸŒ English

<p><p>Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, <i>Electron Energy-Loss Spectroscopy in

Electron Energy-Loss Spectroscopy in the
โœ R.F. Egerton (auth.) ๐Ÿ“‚ Library ๐Ÿ“… 2011 ๐Ÿ› Springer US ๐ŸŒ English

<p><p>Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, <i>Electron Energy-Loss Spectroscopy in

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โœ Anjam Khursheed ๐Ÿ“‚ Library ๐Ÿ“… 2020 ๐Ÿ› World Scientific Publishing ๐ŸŒ English

<span>This book deals with the subject of secondary energy spectroscopy in the scanning electron microscope (SEM). The SEM is a widely used research instrument for scientific and engineering research and its low energy scattered electrons, known as secondary electrons, are used mainly for the purpos

Electron energy loss spectroscopy
โœ Brydson, Rik ๐Ÿ“‚ Library ๐Ÿ“… 2001;2020 ๐Ÿ› BIOS Scientific Publishers; Garland Science ๐ŸŒ English

Electron Energy Loss Spectroscopy (EELS) is a high resolution technique used for the analysis of thin samples of material. The technique is used in many modern transmission electron microscopes to characterise materials. This book provides an up-to-date introduction to the principles and application