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Electron distributions at bulk nickel-solid interfaces examined by electron induced X-ray emission spectroscopy

✍ Scribed by D. Fargues; F. Vergand; C. Bonnelle

Publisher: Elsevier Science
Year: 1985
Weight: 60 KB
Volume: 163
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(85)90897-7

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