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Electron beam tester measurements of switching noise in VLSI circuits

✍ Scribed by Keith A. Jenkins; David F. Heidel

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 914 KB
Volume: 14
Category: Article
ISSN: 0167-9317
DOI: 10.1016/0167-9317(91)90158-a

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