✦ LIBER ✦
Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam tester
✍ Scribed by K.S. Sim; J.C.H. Phang; D.S.H. Chan
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 598 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0167-9317
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