✦ LIBER ✦

Electron-beam-induced diffusion during thin-film depth profiling

Book ID: 104265301
Publisher: Elsevier Science
Year: 1980
Tongue: English
Weight: 158 KB
Volume: 30
Category: Article
ISSN: 0042-207X
DOI: 10.1016/s0042-207x(80)80598-7

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Quantitative Auger electron spectroscopy

Quantitative Auger electron spectroscopy in thin film depth profiling

✍ Siegfried Hofmann 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 627 KB

Electron beam scattering during thin-fil

Electron beam scattering during thin-film processing

✍ Mladenov, G. M. ;Yakimov, T. N. 📂 Article 📅 1977 🏛 John Wiley and Sons 🌐 English ⚖ 373 KB

Metal clustering during depth profiling

Metal clustering during depth profiling of thin films

✍ D. Karpuzov; A. He; S. Xu 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 340 KB

Electron-beam-induced conductivity in th

Electron-beam-induced conductivity in thin insulating films

✍ D.M. Taylor 📂 Article 📅 1979 🏛 Elsevier Science ⚖ 961 KB

Electron-beam-induced patterning of thin

Electron-beam-induced patterning of thin film arsenic-based chalcogenides

✍ K Mietzsch; A.G Fitzgerald 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 312 KB

Amorphous chalcogenides in contact with silver possess a remarkable sensitivity to radiation and have therefore been widely investigated. The present study concentrates on an investigation of nanometer dimension silver lines that can be formed by scanning a focused electron beam across the surface o

Electron beam induced surface modificati

Electron beam induced surface modification of amorphous Sb2Se3 thin film

✍ Oksana Shiman; Vjaceslavs Gerbreders; Eriks Sledevskis; Valfrids Paskevics 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 611 KB