✦ LIBER ✦

Electron and optical beam testing of integrated circuits using CIVA, LIVA, and LECIVA

✍ Scribed by Edward I. Cole Jr.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electron beam duplication of integrated

✍ B. Fay; D.B. Ostrowsky; A.M. Roy; J. Trotel 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 170 KB

Electron beam testing of monolithic inte

✍ J. Fehr; H. Sinnwell; L.J. Balk; E. Kubalek 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 446 KB

4937203 Method and configuration for tes

✍ CharlesW Eichelberger; Robert Wojnarowski; Kenneth Wells 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 85 KB

4884122 Method and configuration for tes

✍ CharlesW Eichelberger; Robert Wojnarowski; Kenneth Welles 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 88 KB

Combining electron and focused ion beam

✍ Robert Heiland; Alan Leslie 📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 487 KB

Picosecond excite and probe optical beam

✍ H. Bergner; K. Hempel; U. Stamm 📂 Article 📅 1991 🏛 Elsevier Science 🌐 English ⚖ 779 KB