4884122 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer

✍ Scribed by CharlesW Eichelberger; Robert Wojnarowski; Kenneth Welles

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 88 KB
• Volume: 30
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(90)90386-2