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Electromigration study of magnetic thin films for the electrical reliability of spin-valve read heads

โœ Scribed by Seongtae Bae, ; I-Fei Tsu, ; Davis, M.; Murdock, E.S.; Judy, J.H.


Book ID
119982851
Publisher
IEEE
Year
2002
Tongue
English
Weight
267 KB
Volume
38
Category
Article
ISSN
0018-9464

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