✦ LIBER ✦
Dependence of electromigration-induced failure lifetimes on NiFe thin-film thickness in giant magnetoresistive spin-valve read heads
✍ Scribed by Bae, Seongtae; Judy, Jack H.; Tsu, I-Fei; Davis, Marshall; Murdock, Edward S.
- Book ID
- 111873467
- Publisher
- American Institute of Physics
- Year
- 2001
- Tongue
- English
- Weight
- 841 KB
- Volume
- 79
- Category
- Article
- ISSN
- 0003-6951
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