✦ LIBER ✦

Electromigration-induced failure of metallic thin films due to transgranular void propagation

✍ Scribed by Gungor, M. Rauf; Maroudas, Dimitrios

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Nonhydrostatic stress effects on failure

✍ M.Rauf Gungor; Dimitrios Maroudas 📂 Article 📅 1999 🏛 Elsevier Science 🌐 English ⚖ 176 KB

Hopf bifurcation, bistability, and onset

✍ Jaeseol Cho; M. Rauf Gungor; Dimitrios Maroudas 📂 Article 📅 2008 🏛 Elsevier Science 🌐 English ⚖ 528 KB

Current-induced non-linear dynamics of v

✍ M.Rauf Gungor; Dimitrios Maroudas 📂 Article 📅 2000 🏛 Elsevier Science 🌐 English ⚖ 197 KB

Nano- and micrometer-scale thin-film-int

✍ K. A. Valiev; R. V. Goldstein; Yu. V. Zhitnikov; T. M. Makhviladze; M. E. Sarych 📂 Article 📅 2009 🏛 Springer 🌐 English ⚖ 376 KB