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Electromigration in gold and copper thin film conductors

✍ Scribed by R.J. Miller; A. Gangulee

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Electromigration threshold of thin-film

✍ V.M. Koleshko; I.V. Kiryushin 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 543 KB

Electromigration in copper conductors

✍ J.R. Lloyd; J.J. Clement 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 761 KB

Electromigration in thin gold films on m

✍ I.A. Blech; E. Kinsbron 📂 Article 📅 1975 🏛 Elsevier Science 🌐 English ⚖ 401 KB

Electromigration and transport reversal

✍ A. Gangulee; F.M. d'Heurle 📂 Article 📅 1973 🏛 Elsevier Science 🌐 English ⚖ 81 KB

Grain boundary and vacancy diffusion mod

✍ J.R. Lloyd; S. Nakahara 📂 Article 📅 1980 🏛 Elsevier Science 🌐 English ⚖ 330 KB

The role of metal and passivation defect

✍ J.R. Lloyd; P.M. Smith; G.S. Prokop 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 866 KB