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Electrode effects in electrical measurements in SiO thin films

✍ Scribed by T.P. Nguyen; S. Minn

Publisher: Elsevier Science
Year: 1979
Tongue: English
Weight: 244 KB
Volume: 31
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(79)90601-x

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