Electrode effects in electrical measurements in SiO thin films : T. P. Nguyen and S. Minn. Solid St. Commun.31, 233 (1979)

• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 130 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90539-0