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Electrochemical and surface analytical characterization of radiation effects after N2+ implantation into Al and Al2O3

✍ Scribed by S. Simson; T. Reier; J.W. Schultze; Chr. Buchal


Book ID
107930496
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
605 KB
Volume
83
Category
Article
ISSN
0257-8972

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