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Electrical Properties of Oval Defects in GaAs Grown by MBE

โœ Scribed by Shinohara, Masanori; Ito, Tomonori; Wada, Kazumi; Imamura, Yoshihiro


Book ID
118064256
Publisher
Institute of Pure and Applied Physics
Year
1984
Tongue
English
Weight
595 KB
Volume
23
Category
Article
ISSN
0021-4922

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๐Ÿ“œ SIMILAR VOLUMES


Oval Defects in the MBE Grown AlGaAs/InG
โœ K. Klima; M. Kaniewska; K. Reginski; J. Kaniewski ๐Ÿ“‚ Article ๐Ÿ“… 1999 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 93 KB

Oval defects were investigated on the surface of complex AlGaAs/InGaAs/GaAs and InGaAs/GaAs multilayer structures grown by molecular beam epitaxy and the results were compared with that obtained for bulk GaAs layers grown by the same technique. The oval defect density was correlated with the gallium