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Electrical properties of He+ion-implanted GaInP

✍ Scribed by S. -L. Fu; T. P. Chin; B. Zhu; C. W. Tu; S. S. Lau; P. M. Asbeck

Book ID: 112822387
Publisher: Springer US
Year: 1994
Tongue: English
Weight: 436 KB
Volume: 23
Category: Article
ISSN: 0361-5235
DOI: 10.1007/bf02671221

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