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Electrical properties of gold-doped silicon

✍ Scribed by Brückner, B.


Publisher
John Wiley and Sons
Year
1971
Tongue
English
Weight
491 KB
Volume
4
Category
Article
ISSN
0031-8965

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## Abstract We present results of the electrical properties of gold‐decorated dislocations in silicon studied by means of Deep Level Transient Spectroscopy (DLTS). We investigated the effect of the gold by measuring DLTS spectra from Schottky diodes having different gold concentrations but same the