The formation of the Cu-Bi2CaSr2Cu208 interface has been studied by photoelectron spectroscopy using synchrotron radiation. Photon energies in the range 20-1000 eV were utilized in order to probe both the valence band and to monitor chemical changes upon Cu deposition, as revealed by the corelevel s
β¦ LIBER β¦
Electrical properties and Tc of Bi2CaSr2Cu2O8 up to pressures of 15 GPA
β Scribed by E.N. van Eenige; R.J. Wijngaarden; H. Hemmes; J.J. Scholtz; J.J. de Kleuver; R. Griessen
- Publisher
- Elsevier Science
- Year
- 1989
- Tongue
- English
- Weight
- 116 KB
- Volume
- 162-164
- Category
- Article
- ISSN
- 0921-4534
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