Electronic and structural properties of the Cu - Bi2CaSr2Cu2O8 interface

✍ Scribed by H. Bernhoff; M. Qvarford; S. Söderholm; A.S. Flodström; J.N. Andersen; R. Nyholm; U.O. Karlsson; I. Lindau

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 280 KB
• Volume: 180
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(91)90649-j

✦ Synopsis

The formation of the Cu-Bi2CaSr2Cu208 interface has been studied by photoelectron spectroscopy using synchrotron radiation. Photon energies in the range 20-1000 eV were utilized in order to probe both the valence band and to monitor chemical changes upon Cu deposition, as revealed by the corelevel shifts. A strong chemical reaction between Bi2CaSr2Cu208 and Cu is manifested by the formation of metallic Bi. From the intensity variations as a function of electron emission angle it is shown that the metallic Bi segregates to the top surface layer.