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Electrical Nanoprobing of Semiconducting Carbon Nanotubes Using an Atomic Force Microscope

✍ Scribed by Yaish, Y.; Park, J.-Y.; Rosenblatt, S.; Sazonova, V.; Brink, M.; McEuen, P. L.

Book ID: 125542286
Publisher: The American Physical Society
Year: 2004
Tongue: English
Weight: 266 KB
Volume: 92
Category: Article
ISSN: 0031-9007
DOI: 10.1103/PhysRevLett.92.046401

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